Your lab must need it ------New Scanning Electron Microscope Sample Preparation System
Are you immersed in the lab for an EBSD sample for a whole day, but you are still struggling with the EBSD sample calibration rate?
Are you careful about a cross-section sample preparation, but you still can't see the cross-section sample information and are bothered?
Are you still upset that a pore structure sample is filled with pore structure when it is mechanically polished, and it is impossible to determine the true information of the sample?
If yes, then you must need it:
It is the GATAN Ilion II 697 argon ion beam polishing system, which was developed from Gatan's classic 691 ion thinner technology. Its advent has changed the limitations of previous manual grinding or polishing of samples by manual or mechanical grinding. Using argon ion precision polishing device, smooth cross section and plane can be obtained without mechanical damage to the sample. It is a new method for SEM sample preparation and has been widely used in research institutes of universities around the world.
The Ilion II 697 can be polished to a wide range of materials, including specimens consisting of multiple elements, and
Alloys, semiconductor materials, polymers and minerals with different mechanical hardness, size and physical properties.
Specific application areas are: • EBSD samples
• Photovoltaic, semiconductor
• Metal (oxide, alloy)
• Ceramic
• Geological samples, oil shale
• Polymer, polymer
• CL
Typical application case:
First, EBSD sample preparation
Argon ion beam polishing uses a high current density argon ion beam to thin the sample. The argon ion is very light relative to the gallium ion. The resulting stress layer and amorphous layer are very thin, which can avoid the experimental data generated by the sample preparation method. Misleading, and because of the small lattice distortion, can improve the calibration rate of EBSD, reduce the calibration parameters, thereby effectively improving the calibration efficiency and saving time. The following three images were sampled using Ilion II at 1 kV and the EBSD results for tungsten carbide/cobalt samples obtained at 20 kV, where cobalt did not undergo a FCC to HCP phase transition. (Photo courtesy of Dr. A Gholinia, University of Manchester, UK).
Second, shale sample preparation
SEM image, field of view: 1mm x 600 microns, visible as small as 4nm pores
Third, the new energy lithium-ion battery
Organic film
Anode cathode
Powder sample cross section
Fourth, the semiconductor industry - PCB board
Five, Si-based solar cells
Obo's DEMO Experimental Center is currently equipped with this argon ion polishing equipment, welcome to come to the sample experience!
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